The X-ray that used to take 99 minutes is ready in 3.5 minutes

A research team from Germany, Japan, and Switzerland has developed a new X-ray technique that uses a single optical element to capture detailed images and reveal chemical properties of materials. This method simplifies and accelerates advanced X-ray experiments. Traditionally, X-ray imaging reveals the shape and position of details, while spectroscopy provides information on chemical composition and electronic structure. The new approach employs a reflective zone plate (RZP), which can simultaneously reflect, focus, and separate soft X-rays. The researchers tested the system with standard test samples, achieving high-resolution images 27 times faster than conventional methods. The results indicate potential for atomic-level material analysis.